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Interference WLI

Vertical scanning white light interference microscopy ( VSI or WLI )  and Phase shift  interference microscopy ( PSI )
for nanometer and sub-nanometer resolution; advanced surface metrology; 3D topology data
 
Vertikal Scanning Weißlicht Interferenzmikroskopie (WLI) und Phasenshift Interferenz Mikroskopie ( PSI ) für Nanometer und Sub-Nanometer Auflösung. Fortgeschrittene Oberflächen Metrology; 3D Topologie-Daten
1 Produkte in Interference WLI 
    
Interference Microscopy option for 3D Surface Metrology in nanometer scale, scanning white light interferometry Mirau and Michelson
Art.No.:WLI-System
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